The latest WeForms software update includes several enhancements and new features designed to improve your testing and measurement experience.
Scope: Added automotive relative compression measurements, additional cursor for automotive analysis, Frequency/Duty/Pulse/Period math options, 1st order software and hardware filters for ADP3X50/ADP2230, Digital Events view, and noise band toggle. Wegen: Dual buffering option for smooth weform switching on AD2 and AD3. Network Analyzer: Increased maximum reference channels from 8 to 32. Tracer: Enhanced support for diode measurement on single AWG channel devices (ADP5000 series) and using the supply channel as collector/drain for higher current (AD2, AD3, ADP2230). General: Dual Mode now supports mixes of the original Analog Discovery, Analog Discovery 2, and Analog Discovery 3. Added an FPGA programming utility for programming bitstreams into Digilent FPGA boards. Default configuration options and append option for export and logging. AD3/ADP2230/ADP3X50/Digital Discovery Specifics: Various enhancements including digital logic input threshold options, reference frequency for internal clocking, min/max with trigger sampling, device buffering for increased capture capacity, configurable sample options, and expanded functionality for Digital Discovery channels. SDK: For developers leveraging our Software Development Kit, this update introduces new functionalities to enhance instrument control and data acquisition. Notably, we’ve added the FDwfDigitalSpiDutySet function for more precise SPI communication timing. Furthermore, we’ve expanded our SPI function set with the inclusion of 64-bit read and write capabilities (e.g., FDwfDigitalSpiWriteRead64), enabling more efficient handling of larger data transfers. These additions provide greater flexibility and control for custom application development using Digilent hardware.
We encourage you to download the new WeForms 3.24 version to take advantage of these improvements and to see all the changes made on the WeForms Change Log.
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